VLSI Test Principles and Architectures: Design for Testability
| By: | Wang, Laung-Terng; Wu, Cheng-Wen; Wen, Xiaoqing |
| Publisher: | Elsevier S & T |
| Print ISBN: | 9780123705976 |
| eText ISBN: | 9780080474793 |
| Edition: | 0 |
| Format: | Page Fidelity |
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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
· Most up-to-date coverage of design for testability.
· Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
· Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
· Lecture slides and exercise solutions for all chapters are now available.
· Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.